Custom Quartz XRD Sample Holders

Parameter	Factory Standard	Manufacturing Limit
Outer L×W×T	Confirmed per instrument model	—
Recess diameter or L×W	Confirmed per sample volume	—
Recess depth	0.2–2 mm	Tighter tolerance, confirmed per order
Recess position	Confirmed per instrument datum	—
Flatness	≤0.02 mm over 100 mm	Tighter, confirmed per order
Instrument compatibility	Confirmed per instrument model	—

Inquiry

Quartz sample holders machined to the recess depth, position, and outer dimensions your diffractometer actually requires — built to fit the instrument, not a generic slide.

Outer dimensions, recess position, and recess depth are checked against your specific instrument, not against a generic holder size — the same nominal holder size can differ in datum position between instrument brands, so send your instrument model or a reference drawing.

Round-Recess, Rectangular-Recess and Custom Holder Formats

Round-recess holders (a circular pocket) and rectangular-recess holders (a square or rectangular pocket) are both standard, sized to your sample volume and instrument's sample stage. Custom formats — multiple recesses, off-center positioning, or a non-standard outer shape — are available where your instrument or sample series calls for it.

Sample Recess Depth, Position and Instrument Compatibility

Recess depth affects sample volume and background signal — too shallow and you don't get enough sample in the beam path, too deep and packing consistency becomes harder to control. Recess position is measured from a stated reference edge that matches how your instrument locates the holder, not from the holder's geometric center unless that's also your instrument's datum.

Quartz XRD Sample Holders Factory Standard & Manufacturing Limit

The table above is what's repeatable without added lead time. Recess depth tolerance and position accuracy are the two figures most likely to need confirmation — both directly affect repeatability between samples, which matters more for XRD holders than for most machined plates.

Precision Pocket Machining, Surface Finishing and Inspection

The recess is CNC-machined into the outer blank, then the surrounding surface ground flat so the holder sits consistently in the instrument stage. Before shipment we check outer dimensions, recess depth, recess position, flatness, surface condition, and fit against the stated instrument model where we have a reference to check against.

±0.05 mmPocket Reference

Low BackgroundAmorphous Quartz

RigakuFormat Reference

BrukerFormat Reference

Depth × W × LPocket Dimensions

PolishedSample Surface

Diffractometer Fit

Sample Height Is Controlled by Recess Depth and Holder Thickness

Controlled Feature	Reference Capability / Requirement
Instrument Format	Matched to Rigaku-, Bruker-class or other holder geometry
Outer Dimensions	Length, width and thickness copied from the instrument interface
Sample Recess	Depth × width × length or diameter stated as functional dimensions
Pocket Tolerance	±0.05 mm industry-reference level where sample height is critical
Recess Position	Located from the holder edges or instrument datum
Material	Amorphous fused quartz selected for low diffraction background
Surface	Sample plane ground or polished as specified
Reference Sample	Existing holder or instrument drawing used where available

Holder Format

Match the Instrument Interface Before the Sample Pocket

Format	Pocket Direction	Required Inputs
Round recess	Powder well or circular specimen	Diameter, depth and center
Rectangular recess	Powder strip or slide format	Length, width, depth and orientation
Zero-background style	Shallow sample area on low-background quartz	Instrument and measurement geometry
Custom instrument format	Outer perimeter and locating features by sample	Existing holder or complete drawing

Available Forms

Configurations Defined by the Process

Round-Pocket HolderCircular powder recess at controlled sample height

Rectangular-Pocket HolderElongated sample area matched to scan geometry

Low-Background SlideAmorphous quartz surface for reduced substrate peaks

Instrument-Specific HolderEdges, tabs and locating features copied from the interface

Applications

Powder X-Ray Diffraction

Routine Powder XRDRepeatable sample height in a matched instrument holder

Low-Background MeasurementsAmorphous fused quartz reduces crystalline holder peaks

Small Sample VolumesShallow or compact recess machined to the method

Replacement HoldersFormat reproduced from Rigaku, Bruker or other instrument hardware

Need an XRD holder matched to your diffractometer?Send instrument model, original holder outline, thickness, recess dimensions, sample height and surface requirement.

Open the Product Configurator

Engineering Data